Yamaichi Electronics offer new products for the wafer-level test of VLSI semiconductors. The new development YVERTICAL® is a vertical probe card with miniaturised spring probe contacts designed for ...
FormFactor has introduced DC-Boost, an advanced TRE test technology to increase probe test capacity. The new wafer-probe-card capability enables more efficient use of tester channels on test equipment ...
Every wafer test touch-down requires a balance between a good electrical contact and preventing damage to the wafer and probe card. Done wrong, it can ruin a wafer and the customized probe card and ...
Wafer level testing is an important part of the supply chain of electronic components. For integrated circuits (ICs), these tests are firmly established - for photonic integrated circuits (PICs), the ...
Taiwanese semiconductor wafer probe card maker WinWay Technology has entered a long-term supply agreement with Italy's Technoprobe, a leading probe card manufacturer, and Greater China distributor MS ...
A new paradigm for semiconductor manufacturing test is coming. Unfortunately, it’s not yet completely defined, and most manufacturers still retain the traditional split between so-called front-end and ...
Wafer probe, one of the key processes for ensuring reliability in semiconductor manufacturing, is becoming increasingly unreliable in multi-die assemblies and at leading-edge nodes. For much of the ...
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