ATC 2.0 Option Enables Dynamic Multisite Sensing and Regulation of Device Temperature for Optimized Test of High-End Automotive SoCs TOKYO, Oct. 24, 2023 (GLOBE NEWSWIRE) -- Leading semiconductor test ...
Advantest Corp. has introduced a test handler for systems-on-a-chip (SOCs) other high-end logic devices that can test up to eight devices at the same time, about twice as fast as the company’s ...
Tokyo, Japan — Advantest Corp. has introduced the M7522 dynamic test handler, which offers the industry's highest processing speed and positioning accuracy for fine-pitch tape automated bonding (TAB) ...
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