Two questions asked in this paper were: is the measurement by 4D InSpec equivalent on the original surface in respect to a replica, that is, how similar are the results? And: under what circumstances ...

Let us help you with your inquiries, brochures and pricing requirements Request A Quote Download PDF Copy Download Brochure The 4D InSpec Surface Gauge from 4D ...

Detecting macro-defects early in the wafer processing flow is vital for yield and process improvement, and it is driving innovations in both inspection techniques and wafer test map analysis. At the ...

Defect states refer to electronic energy levels that arise from imperfections or irregularities in the crystal structure of materials, particularly in semiconductors and insulators. These ...

Relying solely on end-of-line testing isn't enough when security, traceability, and mission reliability are vital.

Although concrete is commonly perceived as a dry and dense substance, it is actually an inherently porous material that more closely resembles a hard sponge. Within concrete’s matrix are microscopic ...

In 2024, the global market size of Wafer Defect Inspection System was estimated to be worth USD 7661 Million and is forecast to reach approximately USD 14430 Million by 2031 with a CAGR of 9.6% during ...

While progress has been made in remediating Sound Transit’s control of studs, their exact root cause remains unknown.