AUSTIN, Texas--(BUSINESS WIRE)--NI (NASDAQ: NATI) today announced the acquisition of SET GmbH (“SET”), long-standing experts in aerospace and defense test system development and recent innovators in ...

During standardized chip fabrication, integrate circuit (IC) testing is conducted repeatedly to inspect the chips once they are manufactured. IC testing begins with wafer penetration before etched ...

NI (Nasdaq: NATI), the provider of solutions that enable engineers and scientists to solve the world’s greatest engineering challenges, announced the NI Semiconductor Test System (STS) series. These ...

Capacitance-voltage (C-V) testing is widely used to determine semiconductor parameters, particularly in MOSCAP and MOSFET structures. However, other types of semiconductor devices and technologies ...

Heterogeneous integration is driving innovation in the semiconductor industry, but it also introduces more complexity in chip design, which translates to more intricate test requirements. The ...

Today’s advanced driver assistance systems (ADAS) require unprecedented computing power – tasked with processing an incredible amount of data from sensors in real-time, making split-second decisions, ...

HSINCHU, Taiwan--(BUSINESS WIRE)--TSMC (TSE: 2330, NYSE: TSM) today announced the Open Innovation Platform ® (OIP) 3DFabric Alliance at the 2022 Open Innovation Platform Ecosystem Forum. The new TSMC ...