A scanning electron microscope, acquired in 2016 with a grant from the National Science Foundation, provides a powerful tool for students, faculty, and visiting researchers to study the structure and ...
Electron microscopy is a powerful imaging technique that utilizes a beam of accelerated electrons to visualize and analyze the structure, composition, and properties of materials at the nanoscale.
This degree of magnification and resolution is made possible by the use of a Focused Ion Beam Scanning Electron Microscope, or FIB-SEM. Ordinary microscopes will not produce the same results. Curious ...
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