Universal software designed to operate any ZEISS light or electron microscope Easy navigation, streamlined SEM operation, and integrated EDS analysis Solution for connected microscopy WHITE PLAINS, ...

Today, ZEISS is introducing its new integrated in situ workflow for ZEISS field emission scanning electron microscopes (FE-SEM). When researchers need to link material performance to microstructure, ...

Over the last 20 years, the proliferation of research utilizing scanning electron microscopy (SEM) has driven the performance of systems towards higher resolution at lower voltages. This enthusiasm is ...

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The Department of Invertebrate Zoology at the Santa Barbara Museum of Natural History’s Collections & Research Center (CRC) upgraded its scanning electron microscope (SEM) in June, switching from the ...

The exact birth of the scanning microscope principle is not clear, as the work of numerous scientists contributed to its inception. However, it is generally accepted that the first scanning microscope ...

STEM operates by focusing a beam of electrons into a narrow probe that is scanned across a thin specimen. As the electrons interact with the sample, they are either scattered or transmitted. The ...

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