Delicate features, uneven surfaces, and extreme density make it difficult to manage probe force and ensure reliability.

Every wafer test touch-down requires a balance between a good electrical contact and preventing damage to the wafer and probe card. Done wrong, it can ruin a wafer and the customized probe card and ...

STAr Technologies, a leading supplier of semiconductor test probe cards, unveils a new one-touch Aries-Prima Memory Test probe card. The probe card is designed specifically to meet the current high ...

SV Probe, a supplier of high-performance probe cards, has signed an agreement to purchase the assets of the wafer-test business of Kulicke & Soffa Industries, a supplier of semiconductor wire-bonding ...

New market study finds that the top six manufacturers of Wafer Test Probe Card occupied nearly 72.09% global market share. LEWES, DELAWARE, UNITED STATES, November 30 ...

LIVERMORE, Calif., Oct. 16, 2019 (GLOBE NEWSWIRE) -- FormFactor, Inc. (NASDAQ: FORM), an industry-leading electrical test and measurement supplier to the semiconductor industry, will showcase new ...

Researchers at the National Institute of Standards and Technology (NIST) have devised a system for manipulating and precisely positioning individual nanowires Researchers at the National Institute of ...

In this interview, Jeremy Hope from Wentworth Laboratories talks to AZoM about why they are attending electronica. Please tell us about the company Wentworth Labs and why you are attending electronica ...

LIVERMORE, Calif., May 29, 2020 (GLOBE NEWSWIRE) -- FormFactor, Inc. (NASDAQ:FORM), a leading semiconductor test and measurement supplier, today announced the release of the SmartMatrix 3000XP probe ...

CERNUSCO LOMBARDONE, Italy--(BUSINESS WIRE)--Technoprobe SpA, a global leader in the microelectronics and semiconductor test industry, will showcase multiple leading-edge technologies during the 30 th ...