Semiconductor IP reuse can yield a 2x improvement in design productivity for semiconductor companies. However, with these startling productivity gains come integration pain. Why? Semiconductor IP is ...

During the manufacture of semiconductor wafers, thickness measurement forms an important part of this process, since it provides process engineers with the information required to ensure that ...

Modern semiconductor manufacturing technology has advanced rapidly. Because of this, measurement using non-contact displacement and transparent coating thickness has become very critical. Applications ...

In the past, EMC compliance has been a unit-level or system-level problem. Now, manufacturers of electronic equipment are beginning to require semiconductor manufacturers to specify radiated and ...

Hamamatsu Photonics has developed the HyperGauge thickness measurement system C17319-11, a new device designed to enhance ...

Ever heard of the Hall voltage? Discovered by Edward Hall in 1879, it’s the voltage perpendicular to the flow of a conductor’s charge that’s used to measure the deflection of movement caused by a ...

(Nanowerk News) A research group including Dr. Toyohiro Chikyo, Unit Director of the Semiconductor Device Materials Group of the Nano-electronic Materials Unit, International Center for Materials ...

As semiconductor technology evolves to the 65nm node and beyond, measurement techniques other than DC source-measure are necessary to effectively characterize new materials and devices due to new ...

An innovative arrangement employing diverse electronic and optical principles and components leads to precision frequency ...

SHANGRAO, JIANGXI, CHINA, January 16, 2026 /EINPresswire.com/ -- In the ever-evolving industrial automation landscape, ...

A team of researchers has uncovered new information about the mass of individual components that make up a promising quasiparticle, known as an exciton, that could play a critical role in future ...