Scan compression reduces the amount of data needed for digital IC manufacturing tests, thereby lowering the cost of executing patterns on the tester. EDA solutions for implementing scan compression on ...
Gas turbine engine components are prone to high- and low-cycle fatigue (HCF and LCF), cracking in critical areas of high stress. Cracks often initiate from local stress concentrations created by ...
IC designers now have a powerful weapon in the struggle against rising test costs: commercially available EDA solutions that provide fast and effective means to implement scan compression on-chip. By ...
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