Achieving sub-ångström (<1 Å) resolution in electron microscopy typically requires a high-energy (>30 keV) beam and a transmission electron microscope (TEM) fitted with an aberration corrector and a ...
We demonstrate the implications of very low voltage operation (<1 kV) of a scanning electron microscope for imaging low-dimensional nanostructures where standard voltages (2–5 kV) involve a beam ...
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