TDK SensEI’s edgeRX Vision system, powered by advanced AI, accurately detects defects in components as small as 1.0×0.5 mm in real time. Operating at speeds up to 2000 parts per minute, it reduces ...
As advanced packaging pushes deeper into the sub-10µm realm, traditional inspection and metrology systems are being forced to evolve with it. Hybrid bonding, a critical enabler of vertical integration ...
A new solution deposition process for semiconductors yields high-performing transistors by introducing more defects, counterintuitively. Researchers used these devices to construct high- speed logic ...
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Image-based model enhances the detection of surface defects in low-light industrial settings
In industry, the detection of anomalies such as scratches, dents, and discolorations is crucial to ensure product quality and safety. However, conventional methods rely on heavy computational ...
Micro-LED display driven with CuIn5Se8 transistors processed by solution deposition. The LEDs are inorganic making them hard to operate without the power available from devices made with the new ...
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