Interesting Engineering on MSN

Korean scientists detect hidden defects in solar cells with 1,000x sensitivity boost

Korean researchers have developed a new analysis method capable of detecting “hidden defects” in semiconductors with a ...
Tech Xplore on MSN

Detecting 'hidden defects' that degrade semiconductor performance with 1,000X higher sensitivity

Semiconductors are used in devices such as memory chips and solar cells, and within them may exist invisible defects that ...
EurekAlert!

KAIST detects ‘hidden defects’ that degrade semiconductor performance with 1,000× higher sensitivity

Semiconductors are used in devices such as memory chips and solar cells, and within them may exist invisible defects that ...
EurekAlert!

Ordered defects may be key for solution-deposited semiconductors, enabling high-speed printable circuits and next-generation displays

Micro-LED display driven with CuIn5Se8 transistors processed by solution deposition. The LEDs are inorganic making them hard to operate without the power available from devices made with the new ...
Semiconductor Engineering

Classification and Localization of Semiconductor Defect Classes in Aggressive Pitches (imec, Screen)

A new technical paper titled “An Evaluation of Continual Learning for Advanced Node Semiconductor Defect Inspection” was published by Imec and SCREEN SPE Germany. “Deep learning-based semiconductor ...
Nasdaq

WiMi Developed Digital Holography-Based Semiconductor Wafer Defect Detection Technology

BEIJING, Aug. 31, 2023 /PRNewswire/ -- WiMi Hologram Cloud Inc. (NASDAQ: WIMI) ("WiMi" or the "Company"), a leading global Hologram Augmented Reality ("AR") Technology provider, today announced that ...
Nasdaq

Applied Materials Unveils SEMVision™ H20 for Enhanced Nanoscale Defect Analysis in Semiconductor Manufacturing

Applied Materials has launched the SEMVision™ H20, a new defect review system designed to enhance the analysis of nanoscale defects in advanced semiconductor chips. This system utilizes cutting-edge ...
Machine Design

NIST, Collaborators Develop New Way of Detecting the Defect Density in Transistors

Defects in transistors, such as unwanted impurities and broken chemical bonds in the various layers of the semiconductor, can limit their performance and reliability. These defects are becoming harder ...
Science Daily

Sensitive new way of detecting transistor defects

Researchers have devised and tested a new, highly sensitive method of detecting and counting defects in transistors -- a matter of urgent concern to the semiconductor industry as it develops new ...