Atomic force microscopy (AFM) is a method of topographical measurement, wherein a fine probe is raster scanned over a material, and the minute variation in probe height is interpreted by laser ...

PFM is based on the converse piezoelectric effect, where an applied electric field induces mechanical strain in piezoelectric materials. In PFM, an AC voltage is applied between a conductive atomic ...

Researchers in China have developed an electrical imaging technique using three-dimensional (3D) tomographic conductive atomic force microscopy (TC-AFM) to go beyond indirect characterization of ...

The Nature Index 2025 Research Leaders — previously known as Annual Tables — reveal the leading institutions and countries/territories in the natural and health sciences, according to their output in ...

Knowing interaction forces between nanostructures and their substrates is important in nanomanufacturing, such as template-directed assembly. A new mechanical membrane-based AFM (atomic force ...

AFM differs significantly from traditional microscopy techniques as it does not project light or electrons on the sample's surface to create its image. Instead, AFM utilizes a sharp probe while ...

An AFM instrument uses a probe with an atomically sharp tip to scan over the surface of a material. There are two main scanning modes with an AFM instrument: contact or dynamic (tapping) mode. Both ...

In July 1985, three physicists—Gerd Binnig of the IBM Zurich Research Laboratory, Christoph Gerber of the University of Basel, and Calvin Quate of Stanford University—puzzled over a problem while ...

Let us help you with your inquiries, brochures and pricing requirements Request A Quote Download PDF Copy Download Brochure AFSEM is an atomic force microscope (AFM ...

Sample preparation will vary depending on the sample, imaging mode, and size of desired images. You will likely need to do a literature search to find the preparation best for your sample. Smaller ...