Boundary scan has traditionally been difficult to promote as a product-design requirement. But boundary-scan success stories have percolated into the electronic-design community, and the availability ...
The IEEE 1149.1 boundary-scan standard was developed almost 15 years ago to resolve the problems associated with limited physical access for probing test points on pc boards and to verify that device ...
Design for testability (DFT) works to make a circuit more testable to ensure that it was manufactured correctly. Alfred Crouch explains the purpose of DFT in his book, Design-For-Test for Digital ICs ...
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