AFM differs significantly from traditional microscopy techniques as it does not project light or electrons on the sample's surface to create its image. Instead, AFM utilizes a sharp probe while ...

Cecilia Van Cauwenberghe explains how to measure the future using nanoscale metrology and discusses the global competition ...

Researchers in China have developed an electrical imaging technique using three-dimensional (3D) tomographic conductive atomic force microscopy (TC-AFM) to go beyond indirect characterization of ...

Atomic force microscopy (AFM) is a way to investigate the surface features of some materials. It works by “feeling” or “touching” the surface with an extremely small probe. This provides a ...

Polymers are used in many industries, including food packaging, tire manufacturing, adhesives, and medical-grade plastics. Photothermal atomic force microscope-based infrared spectroscopy (AFM-IR) ...

Follow Bruker and explore the latest applications of AFM in the semiconductor industry with a panel of experts. What are the recommended cantilevers for measuring the mechanical properties of ...

insights from industryDr. André KörnigApplication ScientistBruker BioAFM In this interview, Dr. André Körnig, Application Scientist at Bruker BioAFM discusses the applications of BioAFM in the life ...

Christoph Gerber, who co-invented the atomic force microscope, tells Matthew Chalmers how the AFM came about 30 years ago and why it continues to shape research at the nanoscale Nano-vision Christoph ...

Researchers at the Ningbo Institute of Materials Technology and Engineering (NIMTE), part of the Chinese Academy of Sciences, ...