AFM is a scanning probe microscopic instrument that consists of a force-sensing microcantilever, a laser source, a piezoelectric scanner and a photodiode detector (Figure 1A). During AFM imaging, the ...

What Is Atomic Force Microscopy? Atomic force microscopy (AFM) is a powerful technique that enables surface ultrastructure visualization at molecular resolution. 1 Besides three-dimensional (3D) ...

(Nanowerk Spotlight – Application Note) In the realm of nanomechanical measurements, AFM is especially suited to working with soft materials due to its piconewton force resolution and sub-nanometer ...

This article serves as a basic introduction to the design and operation of an atomic force microscope. The following sections cover the basic concepts and technologies that help understand the ...

(Nanowerk Spotlight) The realization of a three-dimensional tomic force microscopy (3D AFM) portends exciting research directions across nanoscience and nanotechnology. Demonstrations to date have ...

Atomic Force Microscopy (AFM) is an advanced material imaging technique, which is able to provide accurate topographic images of a surface. It was created by Gerd Binning and Heinrich Rohrer in 1986 ...

In the realm of nanomechanical techniques, AFM is ideally suited to measuring soft materials because of its sub-nanometer vertical displacement accuracy and piconewton force resolution. One of the ...

AFM is particularly well-suited to working with soft materials in the field of nanomechanical measurements, owing to its piconewton force resolution and sub-nanometer vertical displacement accuracy.